Published October 6, 2008
| Version v1
Journal article
Coherent trapping of x-ray photons in crystal cavities in the picosecond regime
Creators
- 1. Department of Physics, National Tsing Hua University (NTHU), Hsinchu 300, Taiwan (China)
- 2. National Synchrotron Radiation Research Center (NSRRC), Hsinchu 300, Taiwan (China)
- 3. Spring-8/JASRI, Mikazuki, Hyogo 679-5198 (Japan)
- 4. Spring-8/RIKEN, Mikazuki, Hyogo 679-5148 (Japan)
Description
We report on the trapping of 14 keV photons in periods of 1.11-1.67 ps by the 12 4 0 backdiffraction in two- and multiplate silicon single-crystal cavities of a few hundred micrometer size. The formation of standing waves inside the cavities ensures better coherence for the x rays. We anticipate that the transmitted x rays through this type of cavities can be used as a quasicoherent x-ray source for probing the dynamic structures of solids, liquids, and biological substances
Additional details
Identifiers
- DOI
- 10.1063/1.2996275;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 93
- Journal Issue
- 14
- Journal Page Range
- p. 141105-141105.3
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40051015
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- KEV RANGE 10-100; MONOCRYSTALS; OPTICS; PHOTONS; RADIATION PRESSURE; SEMICONDUCTOR MATERIALS; SILICON; STANDING WAVES; TRAPPING; X-RAY DIFFRACTION; X-RAY SOURCES
- Descriptors DEC
- BOSONS; COHERENT SCATTERING; CRYSTALS; DIFFRACTION; ELEMENTARY PARTICLES; ELEMENTS; ENERGY RANGE; KEV RANGE; MASSLESS PARTICLES; MATERIALS; RADIATION SOURCES; SCATTERING; SEMIMETALS
Optional Information
- Notes
- (c) 2008 American Institute of Physics