Published December 1992
| Version v1
Report
Open
Calculational evaluation of radiation induced deformation
Creators
- 1. National Research Inst. for Metals, Tsukuba, Ibaraki (Japan). Tsukuba Lab.
Description
A calculational evaluation method has been developed to predict the deformation induced by irradiation, based on a computer simulation of point defect kinetics under stress. Linear stress dependence and similar total creep rate were predicted for both SA and CW materials of austenitic stainless steel at medium to low stresses, in accordance with the reported light-ion irradiation creep results. Low temperature irradiation creep was explained by the transient behavior of point defect kinetics, and inclusion of the transient climb-glide model improved the prediction. Irradiation induced stress relaxation in a light-water fission reactor condition was calculated for Inconel X-750, and it was revealed to be very significant. (author)
Files
25022437.pdf
Files
(163.6 kB)
| Name | Size | Download all |
|---|---|---|
|
md5:758396a7b25315a0873d26b567a23279
|
163.6 kB | Preview Download |
Additional details
Publishing Information
- Imprint Title
- Proceedings of the fourth international symposium on advanced nuclear energy research
- Imprint Pagination
- 676 p.
- Journal Page Range
- p. 387-391.
- Report number
- JAERI-M--92-207
Conference
- Title
- 4. international symposium on advanced nuclear energy research.
- Dates
- 5-7 Feb 1992.
- Place
- Mito (Japan).
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 25022437
- Subject category
- S22: GENERAL STUDIES OF NUCLEAR REACTORS; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COMPUTERIZED SIMULATION; CREEP; DEFORMATION; DISLOCATIONS; IRRADIATION; KINETICS; PHYSICAL RADIATION EFFECTS; POINT DEFECTS; REACTOR MATERIALS; STRESS RELAXATION
- Descriptors DEC
- CRYSTAL DEFECTS; CRYSTAL STRUCTURE; LINE DEFECTS; MATERIALS; MECHANICAL PROPERTIES; RADIATION EFFECTS; SIMULATION
Optional Information
- Secondary number(s)
- JAERI-CONF--1.