Published July 23, 1984 | Version v1
Report Restricted

Novel probe for determining the size and position of a relativistic electron beam

Description

In order to determine the size and position of a relativistic electron beam inside the wiggler magnetic field of a Free Electron Laser (FEL), we have developed a new probe which intercepts the electron beam on a high Z target and monitors the resulting bremsstrahlung radiation. The probe is designed to move along the entire three meters of the wiggler. This FEL is designed to operate in the microwave region (2 to 8 mm) and the interaction region is an oversized waveguide with a cross section 3 cm x 9.8 cm. The axial probe moves inside this waveguide. The probe stops the electron beam on a Tantalum target and the resulting x-rays are scattered in the forward direction. A scintillator behind the beam stop reacts to the x-rays and emits visible light in the region where the x-rays strike. An array of fiber optics behind the scintillator transmits the visible light to a Reticon camera system which images the visible pattern from the scintillator. Processing the optical image is done by digitizing and storing the image and/or recording the image on video tape. Resolution and performance of this probe will be discussed

Availability note (English)

MF available from INIS under the Report Number; Available from NTIS, PC A02/MF A01; 1 as DE85001044.

Files

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Additional details

Publishing Information

Imprint Pagination
11 p.
Report number
UCRL--90555

Conference

Title
SPIE annual technical symposium.
Dates
19-24 Aug 1984.
Place
San Diego, CA (USA).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
16046038
Subject category
S43: PARTICLE ACCELERATORS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BEAM MONITORS; BEAM POSITION; ELECTRON BEAMS; FREE ELECTRON LASERS; IMAGES; OPTICAL SYSTEMS
Descriptors DEC
AMPLIFIERS; BEAMS; EQUIPMENT; LASERS; LEPTON BEAMS; MEASURING INSTRUMENTS; MONITORS; PARTICLE BEAMS

Optional Information

Secondary number(s)
CONF-840872--30.