Nanostructured sapphire vicinal surfaces as templates for the growth of self-organized oxide nanostructures
- 1. Laboratoire Sciences des Procedes Ceramiques et de Traitements de Surface (SPCTS), UMR CNRS 6638, ENSCI, 47-73 Avenue Albert Thomas, F-87065 Limoges Cedex (France)
- 2. Laboratoire de Physique des Materiaux (PHYMAT), UMR CNRS 6630, Universite de Poitiers, Boulevard Marie et Pierre Curie - Teleport 2, BP 30179, F-86962 Futuroscope - Chasseneuil Cedex (France)
Description
Vicinal substrates of sapphire with miscut angle of 10 deg. from the (0 0 1) planes towards the [1 1 0] direction have been annealed in air in the range from 1000 to 1500 deg. C. The behaviour of these surfaces has been characterized as a function of the temperature and the thermal treatment time by Atomic Force Microscopy observations. A thermal treatment at 1250 deg. C allows to stabilize a surface made of periodically spaced nanosized step-bunches. Such stepped surfaces were used as template to grow self-patterned epitaxial oxide nanoparticles by thermal annealing of yttria-stabilized zirconia thin films produced by sol-gel dip-coating. Grazing Incidence Small Angle X-ray Scattering and High-Resolution Transmission Electron Microscopy were used to study the morphology of the nanoparticles and their epitaxial relationships with the substrate.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2009.08.089Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2009.08.089;
- PII
- S0169-4332(09)01233-1;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 256
- Journal Issue
- 3
- Journal Page Range
- p. 924-928
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44018280
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ANNEALING; ATOMIC FORCE MICROSCOPY; DIP COATING; EPITAXY; NANOSTRUCTURES; PERIODICITY; RESOLUTION; SAPPHIRE; SMALL ANGLE SCATTERING; SOL-GEL PROCESS; SUBSTRATES; SURFACES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION; YTTRIUM OXIDES; ZIRCONIUM OXIDES
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; CORUNDUM; CRYSTAL GROWTH METHODS; DEPOSITION; DIFFRACTION; ELECTRON MICROSCOPY; FILMS; HEAT TREATMENTS; MICROSCOPY; MINERALS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; SCATTERING; SURFACE COATING; TRANSITION ELEMENT COMPOUNDS; VARIATIONS; YTTRIUM COMPOUNDS; ZIRCONIUM COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.