High spatial resolution x-ray spectroscopy with the XM-1 X-ray microscope
- 1. Center for X-Ray Optics, LBNL, Berkeley, California 94720 (United States)
- 2. Duke University Free Electron Laser Lab, Durham North Carolina 27708 (United States)
Description
The XM-1 x-ray microscope was built to obtain high-resolution transmission images from a wide variety of thick (< 10 micron) samples. Modeled after a 'conventional' full-field microscope, XM-1 makes use of zone plates (ZP) for the condenser and objective elements. The XM-1 x-ray microscope has been shown to have a spatial resolution of 36 nm by doing a 10%-90% edge scan across a knife edge. Moreover, the condenser ZP and pinhole combination yields good spectral resolution to λ/Δλ of 700. We have shown that with this energy resolution we can distinguish between different elements and some chemical states. We can see spectra with adequate signal to noise even for individual 36nm pixels. With these capabilities, we are beginning work on various experiments in which we will distinguish different chemical species of specific elements within a sample
Additional details
Identifiers
- DOI
- 10.1063/1.1291755;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 521
- Journal Issue
- 1
- Journal Page Range
- p. 35-38
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 11. US national conference on synchrotron radiation instrumentation
- Acronym
- SRI99
- Dates
- 13-15 Oct 1999
- Place
- Stanford, CA (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35041279
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ENERGY RESOLUTION; EXPERIMENT PLANNING; MICROSCOPY; SIGNAL-TO-NOISE RATIO; SPATIAL RESOLUTION; X-RAY SPECTROSCOPY
- Descriptors DEC
- PLANNING; RESOLUTION; SPECTROSCOPY
Optional Information
- Notes
- (c) 2000 American Institute of Physics.