Published June 26, 2000 | Version v1
Journal article

High spatial resolution x-ray spectroscopy with the XM-1 X-ray microscope

  • 1. Center for X-Ray Optics, LBNL, Berkeley, California 94720 (United States)
  • 2. Duke University Free Electron Laser Lab, Durham North Carolina 27708 (United States)

Description

The XM-1 x-ray microscope was built to obtain high-resolution transmission images from a wide variety of thick (< 10 micron) samples. Modeled after a 'conventional' full-field microscope, XM-1 makes use of zone plates (ZP) for the condenser and objective elements. The XM-1 x-ray microscope has been shown to have a spatial resolution of 36 nm by doing a 10%-90% edge scan across a knife edge. Moreover, the condenser ZP and pinhole combination yields good spectral resolution to λ/Δλ of 700. We have shown that with this energy resolution we can distinguish between different elements and some chemical states. We can see spectra with adequate signal to noise even for individual 36nm pixels. With these capabilities, we are beginning work on various experiments in which we will distinguish different chemical species of specific elements within a sample

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
521
Journal Issue
1
Journal Page Range
p. 35-38
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
11. US national conference on synchrotron radiation instrumentation
Acronym
SRI99
Dates
13-15 Oct 1999
Place
Stanford, CA (United States)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
35041279
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ENERGY RESOLUTION; EXPERIMENT PLANNING; MICROSCOPY; SIGNAL-TO-NOISE RATIO; SPATIAL RESOLUTION; X-RAY SPECTROSCOPY
Descriptors DEC
PLANNING; RESOLUTION; SPECTROSCOPY

Optional Information

Notes
(c) 2000 American Institute of Physics.