Installation for the multi-element X-ray fluorescent analysis using a semiconductor detector and X-ray tube

An installation for multielement X-ray fluorescent analysis (XFA) is described. The installation incorporates a semiconductor detector with spectrometric and recording equipments and an X-ray tube with five replaceable anodes as a source of exciting radiation. The possibility of conducting multi-element XFA with almost uniform sensitivity of about (3-10)x10-3% for elements ranging from Ni to U is shown. The influence of the spectrometer characteristics on the threshold sensitivity of the analysis and on the ratio between the threshold sensitivity values calculated by different methods is discussed. The need to take into account of instrumental error when determining threshold concentration is also confirmed