Published December 2017
| Version v1
Journal article
Retroreflection of Optical Radiation from Ellipsoidal-Porous Surfaces
Creators
- 1. Mendeleev Central Research Institute of Chemistry and Mechanics (Russian Federation)
Description
The retroreflection of optical radiation from surfaces with roughness in the form of ellipsoidal pores and two-level roughness in the form of convex ellipsoids with elliptical-porous surfaces is studied using the ROKS-RG Monte-Carlo method software in the geometrical-optics approximation. The dependence of the retroreflection phase function on the parameters of bodies that simulates the rough surface is analyzed. It is shown that the angular dependence of the retroreflection from porous rough surfaces with arbitrarily oriented pores and the aspect ratio higher than unity is a pronounced peak with concave sides at all incidence angles.
Additional details
Identifiers
Publishing Information
- Journal Title
- Optics and Spectroscopy
- Journal Volume
- 123
- Journal Issue
- 6
- Journal Page Range
- p. 977-982
- ISSN
- 0030-400X
- CODEN
- OPSUA3
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 50029859
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- ASPECT RATIO; INCIDENCE ANGLE; MONTE CARLO METHOD; OPTICS; PHASE STUDIES; POROUS MATERIALS; ROUGHNESS; SURFACES
- Descriptors DEC
- CALCULATION METHODS; DIMENSIONLESS NUMBERS; MATERIALS; SURFACE PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2017 Pleiades Publishing, Ltd.