Published December 2017 | Version v1
Journal article

Retroreflection of Optical Radiation from Ellipsoidal-Porous Surfaces

Creators

  • 1. Mendeleev Central Research Institute of Chemistry and Mechanics (Russian Federation)

Description

The retroreflection of optical radiation from surfaces with roughness in the form of ellipsoidal pores and two-level roughness in the form of convex ellipsoids with elliptical-porous surfaces is studied using the ROKS-RG Monte-Carlo method software in the geometrical-optics approximation. The dependence of the retroreflection phase function on the parameters of bodies that simulates the rough surface is analyzed. It is shown that the angular dependence of the retroreflection from porous rough surfaces with arbitrarily oriented pores and the aspect ratio higher than unity is a pronounced peak with concave sides at all incidence angles.

Additional details

Identifiers

Publishing Information

Journal Title
Optics and Spectroscopy
Journal Volume
123
Journal Issue
6
Journal Page Range
p. 977-982
ISSN
0030-400X
CODEN
OPSUA3

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
50029859
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Descriptors DEI
ASPECT RATIO; INCIDENCE ANGLE; MONTE CARLO METHOD; OPTICS; PHASE STUDIES; POROUS MATERIALS; ROUGHNESS; SURFACES
Descriptors DEC
CALCULATION METHODS; DIMENSIONLESS NUMBERS; MATERIALS; SURFACE PROPERTIES

Optional Information

Copyright
Copyright (c) 2017 Pleiades Publishing, Ltd.