Published March 2013 | Version v1
Journal article

Ultrafast transverse thermoelectric response in c-axis inclined epitaxial La0.5Sr0.5CoO3 thin films

  • 1. Max Planck Institute for Solid State Research, Heisenbergstrasse 1, 70569 Stuttgart (Germany)
  • 2. Institute of Advanced Materials for Photoelectrons, Faculty of Materials Science and Engineering, Kunming University of Science and Technology, Kunming 650051 (China)
  • 3. Institut Jean Lamour, UMR 7198-CNRS, Universite de Lorraine, 54011 Nancy (France)

Description

Ultrafast transverse thermoelectric voltage response has been observed in c-axis inclined epitaxial La0.5Sr0.5CoO3thin films. Voltage signals with the rise time of 7 ns have been detected under the irradiation of pulse laser with duration of 28 ns. A concept, named response rate ratio, has been proposed to evaluate the intrinsic response rate, and this ratio in La0.5Sr0.5CoO3is smaller than that in other reported materials. The low resistivity is thought to be responsible for the ultrafast response, as low resistivity induces small optical penetration depth, and response time has a monotonous increasing relationship with this depth. Transverse thermoelectric voltage with the rise time of 7 ns in La0.5Sr0.5CoO3thin film. (copyright 2013 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim) (orig.)

Availability note (English)

Available from: http://dx.doi.org/10.1002/pssr.201307002

Additional details

Identifiers

Publishing Information

Journal Title
Physica Status Solidi. Rapid Research Letters (Online)
Journal Volume
7
Journal Issue
3
Journal Page Range
p. 180-183
ISSN
1862-6270
CODEN
PSSRCS

Optional Information

Notes
With 3 figs., 1 tab., 32 refs.