Published May 2013 | Version v1
Journal article

Formation and characterization of microstructure of as-cast Mg–6Gd–4Y–xZn–0.5Zr (x = 0.3, 0.5 and 0.7 wt.%) alloys

  • 1. State Key Laboratory of Metal Matrix Composites, Shanghai Jiao Tong University, Shanghai 200240 (China)
  • 2. National Engineering Research Center of Light Alloy Net Forming, Shanghai Jiao Tong University, Shanghai 200240 (China)

Description

Mg–6Gd–4Y–xZn–0.5Zr (x = 0.3, 0.5 and 0.7 wt.%) alloys were prepared via conventional ingot metallurgy (I/M) in this study. The as-cast microstructures of these alloys were established by X-ray diffraction (XRD) analyses, optical microscope (OM), scanning electron microscope (SEM) and transmission electron microscope (TEM) observations. Lamellar stacking order (SF) and 14H-type long period stacking order (LPSO) structure within α-Mg matrix are formed in the three as-cast alloys. The eutectic secondary phase is (Mg,Zn)24(Gd,Y)5 for the alloy containing 0.3 wt.% Zn, while, it is (Mg,Zn)3(Gd,Y) for the alloys containing 0.5 wt.% Zn and 0.7 wt.% Zn. Moreover, X phase-(Mg,Zn)12(Gd,Y) is formed in the latter two as-cast alloys. - Highlights: • LPSO structure has first been found in as-cast Mg–6Gd–4Y–xZn–0.5Zr. • X-phase exists in as-cast Mg–6Gd–4Y–0.3(0.5)Zn–0.5Zr. • Zn content results in different β-phase in the studied alloys

Availability note (English)

Available from http://dx.doi.org/10.1016/j.matchar.2013.03.002

Additional details

Identifiers

DOI
10.1016/j.matchar.2013.03.002;
PII
S1044-5803(13)00057-0;

Publishing Information

Journal Title
Materials Characterization
Journal Volume
79
Journal Page Range
p. 93-99
ISSN
1044-5803
CODEN
MACHEX

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45106471
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ALLOYS; EUTECTICS; METALLURGY; MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; MICROSCOPY; SCATTERING

Optional Information

Copyright
Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.