Formation and characterization of microstructure of as-cast Mg–6Gd–4Y–xZn–0.5Zr (x = 0.3, 0.5 and 0.7 wt.%) alloys
- 1. State Key Laboratory of Metal Matrix Composites, Shanghai Jiao Tong University, Shanghai 200240 (China)
- 2. National Engineering Research Center of Light Alloy Net Forming, Shanghai Jiao Tong University, Shanghai 200240 (China)
Description
Mg–6Gd–4Y–xZn–0.5Zr (x = 0.3, 0.5 and 0.7 wt.%) alloys were prepared via conventional ingot metallurgy (I/M) in this study. The as-cast microstructures of these alloys were established by X-ray diffraction (XRD) analyses, optical microscope (OM), scanning electron microscope (SEM) and transmission electron microscope (TEM) observations. Lamellar stacking order (SF) and 14H-type long period stacking order (LPSO) structure within α-Mg matrix are formed in the three as-cast alloys. The eutectic secondary phase is (Mg,Zn)24(Gd,Y)5 for the alloy containing 0.3 wt.% Zn, while, it is (Mg,Zn)3(Gd,Y) for the alloys containing 0.5 wt.% Zn and 0.7 wt.% Zn. Moreover, X phase-(Mg,Zn)12(Gd,Y) is formed in the latter two as-cast alloys. - Highlights: • LPSO structure has first been found in as-cast Mg–6Gd–4Y–xZn–0.5Zr. • X-phase exists in as-cast Mg–6Gd–4Y–0.3(0.5)Zn–0.5Zr. • Zn content results in different β-phase in the studied alloys
Availability note (English)
Available from http://dx.doi.org/10.1016/j.matchar.2013.03.002Additional details
Identifiers
- DOI
- 10.1016/j.matchar.2013.03.002;
- PII
- S1044-5803(13)00057-0;
Publishing Information
- Journal Title
- Materials Characterization
- Journal Volume
- 79
- Journal Page Range
- p. 93-99
- ISSN
- 1044-5803
- CODEN
- MACHEX
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45106471
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALLOYS; EUTECTICS; METALLURGY; MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; MICROSCOPY; SCATTERING
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.