Microwave dielectric properties of PTFE/rutile nanocomposites
Creators
- 1. Microwave Materials Division, Centre for Materials for Electronics Technology (C-MET), Department of Information Technology, Government of India, Athani P.O., Thrissur, Kerala 680771 (India)
Description
The effects of nano-size rutile filler on the microwave dielectric properties of PTFE composites were investigated and the results were compared with that of micron size rutile filled composites. Nano-size rutile powder was prepared through sol-gel route and the filled PTFE composites were fabricated through SMECH process. Different characterization techniques such as powder X-ray diffraction, SEM, BET, TEM and TG/DSC were employed to analyze the nature of ceramic filler. The dielectric properties of filled composites were evaluated at microwave frequency region using waveguide cavity perturbation technique. Different theoretical models have been employed to predict the variation of dielectric constant with respect to filler loading. The moisture absorption characteristics of nano-rutile filled PTFE composites were measured as per IPC-TM-650 2.6.2 standards. Composites show high dielectric constant at X-band frequency region with relatively high loss tangent compared to micron size counterpart.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jallcom.2008.10.092Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2008.10.092;
- PII
- S0925-8388(08)01778-7;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 477
- Journal Issue
- 1-2
- Journal Page Range
- p. 677-682
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41044803
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- COMPOSITE MATERIALS; MICROWAVE RADIATION; NANOSTRUCTURES; PERMITTIVITY; RUTILE; SCANNING ELECTRON MICROSCOPY; TEFLON; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIELECTRIC PROPERTIES; DIFFRACTION; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; FLUORINATED ALIPHATIC HYDROCARBONS; HALOGENATED ALIPHATIC HYDROCARBONS; MATERIALS; MICROSCOPY; MINERALS; ORGANIC COMPOUNDS; ORGANIC FLUORINE COMPOUNDS; ORGANIC HALOGEN COMPOUNDS; ORGANIC POLYMERS; OXIDE MINERALS; PETROCHEMICALS; PETROLEUM PRODUCTS; PHYSICAL PROPERTIES; PLASTICS; POLYETHYLENES; POLYMERS; POLYOLEFINS; POLYTETRAFLUOROETHYLENE; RADIATIONS; RADIOACTIVE MATERIALS; RADIOACTIVE MINERALS; SCATTERING; SYNTHETIC MATERIALS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.