Published May 8, 2000
| Version v1
Journal article
Study of double-strangeness nuclei with hybrid-emulsion method (KEK-PS E373)
Creators
- Ichikawa, A.
- Ahn, J. K.
- Akaishi, Y.
- Akikawa, H.
- Aoki, S.
- Bahk, S. Y.
- Baik, K. M.
- Chung, M. S.
- Fukuda, T.
- Hoshino, K.
- Ichikawa, A.
- Ieiri, M.
- Imai, K.
- Iwata, Y.
- Kanda, H.
- Kaneko, M.
- Kawai, T.
- Kim, C. O.
- Kim, J. Y.
- Kim, S. J.
- Kondo, Y.
- Motoba, T.
- Nagoshi, C.
- Nakazawa, K.
- Noumi, H.
- Ogawa, S.
- Okabe, H.
- Oyama, K.
- Park, H. M.
- Park, I. G.
- Ra, Y. S.
- Rhee, J. T.
- Sekimoto, M.
- Shibuya, H.
- Sim, K. S.
- Song, J. S.
- Takahashi, H.
- Takahashi, T.
- Takeutchi, F.
- Tanaka, H.
- Tojo, J.
- Torii, H.
- Torikai, S.
- Ushida, N.
- Yamamoto, K.
- Yamamoto, Y.
- Yang, J. T.
- Yasuda, N.
- Yoon, C. J.
- Yoshida, T.
- Yosoi, Y.
Description
An experiment to search for double-strangeness nuclei in nuclear emulsion is now being carried on as KEK-PS E373. Preliminary results of the data analysis for the K+ spectrometer and the scintillating fiber detectors are presented. Status of the automatic track finding method for the emulsion is reported
Additional details
Identifiers
- PII
- S0375947400001159;
Publishing Information
- Journal Title
- Nuclear Physics. A
- Journal Volume
- 670
- Journal Issue
- 1-4
- Journal Page Range
- p. 289c-292c
- ISSN
- 0375-9474
- CODEN
- NUPABL
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 34042656
- Subject category
- S73: NUCLEAR PHYSICS AND RADIATION PHYSICS;
- Descriptors DEI
- CARBON 12 TARGET; HYPERNUCLEI; KAON MINUS REACTIONS; KAON PLUS REACTIONS; NUCLEAR EMULSIONS; PARTICLE PRODUCTION; PLASTIC SCINTILLATION DETECTORS; XI BARYONS
- Descriptors DEC
- BARYONS; CHARGED-PARTICLE REACTIONS; ELEMENTARY PARTICLES; FERMIONS; HADRON REACTIONS; HADRONS; HYPERONS; KAON REACTIONS; MEASURING INSTRUMENTS; MESON REACTIONS; NUCLEAR FRAGMENTS; NUCLEAR REACTIONS; NUCLEI; RADIATION DETECTORS; SCINTILLATION COUNTERS; SOLID SCINTILLATION DETECTORS; STRANGE PARTICLES; TARGETS
Optional Information
- Copyright
- Copyright (c) 2000 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.