Published May 22, 2006
| Version v1
Journal article
Novel displacement in transmission through a two-dimensional semiconductor barrier
Creators
- 1. Department of Physics, Shanghai University, 99 Shangda Road, Shanghai 200444 (China)
- 2. Department of Physics, Shanghai University, 99 Shangda Road, Shanghai 200444 (China) and State Key Laboratory of Transient Optics Technology, Xi'an Institute of Optics and Precision Mechanics, Academia Sinica, 322 West Youyi Road, Xi'an 710068 (China)
Description
The lateral displacement of electron beams transmitting through a two-dimensional semiconductor barrier is quite different from the prediction from Snell's law for electron waves. It is shown that the displacement can be greatly enhanced by transmission resonance when the incidence angle is less than but close to the critical angle for total reflection. The displacement depends not only on the barrier's thickness but also on the incidence angle and the incidence energy. The influence of electron's effective mass is also discussed. Theoretical results of the stationary-phase approach are confirmed by numerical simulations for a Gaussian-shaped incident beam. These phenomena may lead to novel applications in quantum electronic devices
Additional details
Identifiers
- DOI
- 10.1016/j.physleta.2006.01.023;
- PII
- S0375-9601(06)00058-2;
Publishing Information
- Journal Title
- Physics Letters. A
- Journal Volume
- 354
- Journal Issue
- 1-2
- Journal Page Range
- p. 161-165
- ISSN
- 0375-9601
- CODEN
- PYLAAG
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37068836
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- COMPUTERIZED SIMULATION; EFFECTIVE MASS; ELECTRON BEAMS; ELECTRONIC EQUIPMENT; ELECTRONS; INCIDENCE ANGLE; QUANTUM ELECTRONICS; REFLECTION; RESONANCE; SEMICONDUCTOR MATERIALS; THICKNESS; TRANSMISSION; TWO-DIMENSIONAL CALCULATIONS
- Descriptors DEC
- BEAMS; DIMENSIONS; ELEMENTARY PARTICLES; EQUIPMENT; FERMIONS; LEPTON BEAMS; LEPTONS; MASS; MATERIALS; PARTICLE BEAMS; SIMULATION
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.