Published September 1, 2006
| Version v1
Journal article
Effect of accidental beam losses on the ATLAS pixel detector
- 1. INFN and University of Milano, Milan (Italy)
- 2. Lawrence Berkeley National Lab, Berkeley, CA (United States)
- 3. INFN, Genova (Italy)
- 4. Academy of Sciences of the Czech Republic, Prague (Czech Republic)
Description
The ATLAS pixel detector has been designed to sustain a dose of 500 kGy integrated over 10 years of operation. This very substantial radiation hardness should also favor the survival of the detector in case of accidental beam losses. The effect of a very intensive beam releasing a high instantaneous dose in the pixel detector has been measured in a short experiment performed at the CERN Proton Synchrotron. The results confirm that the ATLAS pixel detector can survive to beam losses with minimal or no deterioration of performance
Additional details
Identifiers
- DOI
- 10.1016/j.nima.2006.04.086;
- PII
- S0168-9002(06)00716-9;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 565
- Journal Issue
- 1
- Journal Page Range
- p. 50-54
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- International workshop on semiconductor pixel detectors for particles and imaging
- Acronym
- PIXEL 2005
- Dates
- 5-8 Sep 2005
- Place
- Bonn (Germany)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38032167
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAMS; CERN LHC; OPERATION; PERFORMANCE; PROTONS; RADIATION DOSES; SI SEMICONDUCTOR DETECTORS
- Descriptors DEC
- ACCELERATORS; BARYONS; CYCLIC ACCELERATORS; DOSES; ELEMENTARY PARTICLES; FERMIONS; HADRONS; MEASURING INSTRUMENTS; NUCLEONS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; STORAGE RINGS; SYNCHROTRONS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.