Published January 1993
| Version v1
Journal article
A low-wave-vector expansion for reflectivity
Creators
- 1. Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139 (United States)
- 2. Department of Nuclear Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139 (United States)
Description
We expand an accurate, closed-form equation for the reflectivity in a power series around q2=0, where q2 is the z component of the wave-vector transfer in a film of constant composition. We examine, in particular, the case where q2=0 at the critical edge. Such an example might be realized through a neutron-reflectivity experiment on a microemulsion that exhibits surface layering. We find the coefficients of this low-wave-vector expansion to be the moments of the scattering-length density profile. We demonstrate how the first moment of the profile can be obtained from an accurate reflectivity measurement
Additional details
Publishing Information
- Journal Title
- Physical Review. E, Statistical Physics, Plasmas, Fluids and Related Interdisciplinary Topics
- Journal Volume
- 47
- Journal Issue
- 1
- Journal Page Range
- p. 743-746.
- ISSN
- 1063-651X
- CODEN
- PLEEE8
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 24040680
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- DENSITY; DWBA; NEUTRON DIFFRACTION; REFLECTIVITY; THIN FILMS
- Descriptors DEC
- BORN APPROXIMATION; COHERENT SCATTERING; DIFFRACTION; FILMS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; SCATTERING; SURFACE PROPERTIES