Published January 1993 | Version v1
Journal article

A low-wave-vector expansion for reflectivity

  • 1. Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139 (United States)
  • 2. Department of Nuclear Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139 (United States)

Description

We expand an accurate, closed-form equation for the reflectivity in a power series around q2=0, where q2 is the z component of the wave-vector transfer in a film of constant composition. We examine, in particular, the case where q2=0 at the critical edge. Such an example might be realized through a neutron-reflectivity experiment on a microemulsion that exhibits surface layering. We find the coefficients of this low-wave-vector expansion to be the moments of the scattering-length density profile. We demonstrate how the first moment of the profile can be obtained from an accurate reflectivity measurement

Additional details

Publishing Information

Journal Title
Physical Review. E, Statistical Physics, Plasmas, Fluids and Related Interdisciplinary Topics
Journal Volume
47
Journal Issue
1
Journal Page Range
p. 743-746.
ISSN
1063-651X
CODEN
PLEEE8

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
24040680
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
DENSITY; DWBA; NEUTRON DIFFRACTION; REFLECTIVITY; THIN FILMS
Descriptors DEC
BORN APPROXIMATION; COHERENT SCATTERING; DIFFRACTION; FILMS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; SCATTERING; SURFACE PROPERTIES