Published May 12, 2004 | Version v1
Journal article Metadata-only

An Improvement of (X, eX) Spectrometer for Coincident Measurement of Compton Scattered Photon and Recoiled Electron

Creators

  • 1. Department of Electronic Engineering, Faculty of Engineering, Gunma University, 1-5-1 Tenjincho, Kiryu, Gunma 376-8515 (Japan)
  • 2. The Japan Synchrotron Radiation Research Institute (JASRI), Hyogo 679-5198 (Japan)
  • 3. Photon Factory, Institute of Materials Structure Science, High Energy Accelerator Research Organization, 1-1 Oho, Tsukuba, Ibaraki 305-0801 (Japan)
  • 4. Department of Materials Structure Science, Graduate University for Advanced Studies, 1-1 Oho, Tsukuba, Ibaraki 305-0801 (Japan)

Description

A coincident measurement between the Compton scattered photon and the recoiled electron gives information about three dimensional electron momentum density (3D-EMD). We improve our (X, eX) spectrometer by introducing a two-dimensional area photon detector which consists of an array of BGO scintillators and a position sensitive photoelectron multiplier tube in order to obtain the 3D-EMD over whole momentum space. We present the details of the improved system, performance and some experimental results

Additional details

Identifiers

DOI
10.1063/1.1757966;

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
705
Journal Issue
1
Journal Page Range
p. 1001-1004
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
8. international conference on synchrotron radiation instrumentation
Dates
25-29 Aug 2003
Place
San Francisco, CA (United States)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
36092373
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
COMPTON EFFECT; ELECTRON DENSITY; ELECTRON DETECTION; ELECTRON MULTIPLIERS; ELECTRONS; PERFORMANCE; PHOSPHORS; PHOTONS; THIN FILMS; THREE-DIMENSIONAL CALCULATIONS; TWO-DIMENSIONAL CALCULATIONS; X-RAY SPECTROMETERS
Descriptors DEC
BASIC INTERACTIONS; BOSONS; CHARGED PARTICLE DETECTION; DETECTION; ELASTIC SCATTERING; ELECTROMAGNETIC INTERACTIONS; ELECTRON TUBES; ELEMENTARY PARTICLES; FERMIONS; FILMS; INTERACTIONS; LEPTONS; MASSLESS PARTICLES; MEASURING INSTRUMENTS; RADIATION DETECTION; SCATTERING; SPECTROMETERS

Optional Information

Notes
(c) 2004 American Institute of Physics