Melt nonstoichiometry and defect structure of ZnGeP2 crystals
Creators
- 1. Russian Academy of Sciences, Institute of Monitoring of Climatic and Ecological Systems, Siberian Branch (Russian Federation)
- 2. Russian Academy of Sciences, Institute of Semiconductor Physics, Siberian Branch (Russian Federation)
- 3. Novgorod State University (Russian Federation)
- 4. Russian Academy of Sciences, Institute of High-Current Electronics, Siberian Branch (Russian Federation)
- 5. Groupe d'Etude de la Matiere Condensee (GEMaC) UMR 8635 CNRS-Universite de Versailles-Saint Quentin (France)
Description
The defect structure of ZnGeP2 crystals grown from a melt by the vertical Bridgman method has been investigated. A deviation of the melt composition from stoichiometric leads to the formation of striations and the inclusions of other phases which are observed as structures (chains) oriented parallel to the growth axis. According to the microanalysis data, the inclusion composition corresponds to a mixture of ZnGeP2, Zn3P2, and Ge. Nanoinclusions of germanium phosphide are detected by transmission electron microscopy. X-ray topography reveals defects of four types. The main defects in the central part of an ingot are related to the composition fluctuations, and the newly formed dislocations are basically single ones. Most dislocations are formed at the crystal periphery.
Additional details
Identifiers
Publishing Information
- Journal Title
- Crystallography Reports
- Journal Volume
- 55
- Journal Issue
- 1
- Journal Page Range
- p. 65-70
- ISSN
- 1063-7745
- CODEN
- CYSTE3
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44011239
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- BRIDGMAN METHOD; CRYSTALS; DISLOCATIONS; FLUCTUATIONS; GERMANIUM PHOSPHIDES; INCLUSIONS; MICROANALYSIS; STOICHIOMETRY; STRIATIONS; TOPOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY; X RADIATION; ZINC PHOSPHIDES
- Descriptors DEC
- CRYSTAL DEFECTS; CRYSTAL GROWTH METHODS; CRYSTAL STRUCTURE; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; GERMANIUM COMPOUNDS; IONIZING RADIATIONS; LINE DEFECTS; MICROSCOPY; PHOSPHIDES; PHOSPHORUS COMPOUNDS; PNICTIDES; RADIATIONS; VARIATIONS; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2010 Pleiades Publishing, Ltd.