Beam parameters of FLASH beamline BL1 from Hartmann wavefront measurements
Creators
- 1. Laser-Laboratorium Goettingen, Hans-Adolf-Krebs-Weg 1, D-37077 Goettingen (Germany)
- 2. Deutsches Elektronen-Synchrotron, Notkestrasse 85, D-22603 Hamburg (Germany)
Description
We report on online measurements of beam parameters in the soft X-ray and extreme ultraviolet (EUV) spectral range at the free-electron laser FLASH. A compact, self-supporting Hartmann sensor operating in the wavelength range from 6 to 30 nm was used to determine the wavefront quality of individual free-electron laser (FEL) pulses. Beam characterization and alignment of beamline BL1 was performed with λ13.5nm/90 accuracy for wavefront rms (wrms). A spot size of 159 μm (second moment) and other beam parameters are computed using a spherical reference wavefront generated by a 5 μm pinhole. Beam parameters are also computed relative to a reference wavefront created by a laser-driven plasma source of low coherence, proving the feasibility of such a calibration and reaching λ13.5nm/7.5 wrms accuracy. The sensor was used for alignment of the toroidal focusing mirror of beamline BL1, resulting in a reduction of wrms by 25%, and to investigate wavefront distortions induced by thin solid filters.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2010.10.016Additional details
Identifiers
- DOI
- 10.1016/j.nima.2010.10.016;
- PII
- S0168-9002(10)02245-X;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 635
- Journal Issue
- 1,Supplement
- Journal Page Range
- p. S108-S112
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- EuroFEL workshop on photon beamlines and diagnostics
- Acronym
- PhotonDiag 2010
- Dates
- 28-30 Jun 2010
- Place
- Hamburg (Germany)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42096891
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCURACY; BEAMS; CALIBRATION; EXTREME ULTRAVIOLET RADIATION; FILTERS; FOCUSING; FREE ELECTRON LASERS; MIRRORS; PLASMA; PULSES; SENSORS; SOFT X RADIATION; SPHERICAL CONFIGURATION; WAVELENGTHS
- Descriptors DEC
- CONFIGURATION; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; LASERS; RADIATIONS; ULTRAVIOLET RADIATION; X RADIATION
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.