Published September 3, 2008 | Version v1
Journal article

Electron transfer processes between sputtered O atoms and Ag(110):O(n x 1) reconstructed surfaces

  • 1. CNRS, UMR 8625, Laboratoire des Collisions Atomiques et Moleculaires, LCAM, Batiment 351, UPS-11, F-91405 Orsay (France)
  • 2. Uzhgorod Centre, Kiev National Trade-Economic University, Korytnjanska, 4. 88020 Uzhgorod (Ukraine)

Description

We present results of a study of sputtered oxygen atom outgoing trajectory dependence of the electron transfers with oxidized Ag(110) surfaces reconstructed in different (n x 1) added row structures. With a charge state resolved time-of-flight-direct recoil spectroscopy investigation using 4 keV Ar+ incident ions, we determine relative yields of sputtered O and Ag atoms as well as the fraction of sputtered O- ions, for different incident polar and azimuthal angles. The relative yields of sputtered O atoms are satisfactorily reproduced by a classical dynamics simulation. No sputtered Ag- ions were detected. A qualitative discussion of the features of the oxygen negative ion fractions suggests that its description needs, in general, to take into account both capture and loss of electrons as the oxygen atom leaves the surface. The experimental data also suggest that one needs to correctly describe the corrugation of the surface and that the electron loss rates should be site-specific

Availability note (English)

Available from http://dx.doi.org/10.1088/0953-8984/20/35/355008

Additional details

Identifiers

DOI
10.1088/0953-8984/20/35/355008;
PII
S0953-8984(08)79860-6;

Publishing Information

Journal Title
Journal of Physics. Condensed Matter
Journal Volume
20
Journal Issue
35
Journal Page Range
[7 p.]
ISSN
0953-8984
CODEN
JCOMEL

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40033195
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
ANIONS; ARGON IONS; ATOMS; CAPTURE; CHARGE STATES; ELECTRON LOSS; ELECTRON TRANSFER; KEV RANGE; OXYGEN; OXYGEN IONS; RECOILS; SILVER; SIMULATION; SPECTROSCOPY; SPUTTERING; SURFACES; TIME-OF-FLIGHT METHOD
Descriptors DEC
CHARGED PARTICLES; ELEMENTS; ENERGY RANGE; IONS; METALS; NONMETALS; TRANSITION ELEMENTS