Electron transfer processes between sputtered O atoms and Ag(110):O(n x 1) reconstructed surfaces
Creators
- 1. CNRS, UMR 8625, Laboratoire des Collisions Atomiques et Moleculaires, LCAM, Batiment 351, UPS-11, F-91405 Orsay (France)
- 2. Uzhgorod Centre, Kiev National Trade-Economic University, Korytnjanska, 4. 88020 Uzhgorod (Ukraine)
Description
We present results of a study of sputtered oxygen atom outgoing trajectory dependence of the electron transfers with oxidized Ag(110) surfaces reconstructed in different (n x 1) added row structures. With a charge state resolved time-of-flight-direct recoil spectroscopy investigation using 4 keV Ar+ incident ions, we determine relative yields of sputtered O and Ag atoms as well as the fraction of sputtered O- ions, for different incident polar and azimuthal angles. The relative yields of sputtered O atoms are satisfactorily reproduced by a classical dynamics simulation. No sputtered Ag- ions were detected. A qualitative discussion of the features of the oxygen negative ion fractions suggests that its description needs, in general, to take into account both capture and loss of electrons as the oxygen atom leaves the surface. The experimental data also suggest that one needs to correctly describe the corrugation of the surface and that the electron loss rates should be site-specific
Availability note (English)
Available from http://dx.doi.org/10.1088/0953-8984/20/35/355008Additional details
Identifiers
- DOI
- 10.1088/0953-8984/20/35/355008;
- PII
- S0953-8984(08)79860-6;
Publishing Information
- Journal Title
- Journal of Physics. Condensed Matter
- Journal Volume
- 20
- Journal Issue
- 35
- Journal Page Range
- [7 p.]
- ISSN
- 0953-8984
- CODEN
- JCOMEL
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40033195
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ANIONS; ARGON IONS; ATOMS; CAPTURE; CHARGE STATES; ELECTRON LOSS; ELECTRON TRANSFER; KEV RANGE; OXYGEN; OXYGEN IONS; RECOILS; SILVER; SIMULATION; SPECTROSCOPY; SPUTTERING; SURFACES; TIME-OF-FLIGHT METHOD
- Descriptors DEC
- CHARGED PARTICLES; ELEMENTS; ENERGY RANGE; IONS; METALS; NONMETALS; TRANSITION ELEMENTS