Published July 2015
| Version v1
Journal article
A digital CDS technique and its performance testing
- 1. Key Laboratory of Particle Astrophysics, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing (China)
- 2. College of Physics, Jilin University, No.2699, Qianjin Road, Changchun (China)
Description
Readout noise is a critical parameter for characterizing the performance of charge-coupled devices (CCDs), which can be greatly reduced by the correlated double sampling (CDS) circuit. However, a conventional CDS circuit inevitably introduces new noise since it consists of several active analog components such as operational amplifiers. This paper proposes a digital CDS circuit technique, which transforms the pre-amplified CCD signal into a train of digital presentations by a high-speed data acquisition card directly without the noisy CDS circuit, then implements the digital CDS algorithm through a numerical method. A readout noise of 3.3 e- and an energy resolution of 121 eV@5.9 keV can be achieved via the digital CDS technique. (authors)
Additional details
Identifiers
Publishing Information
- Journal Title
- Chinese Physics. C, High Energy Physics and Nuclear Physics
- Journal Volume
- 39
- Journal Issue
- 7
- Journal Page Range
- [5 p.]
- ISSN
- 1674-1137
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 49047343
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ALGORITHMS; CHARGE-COUPLED DEVICES; DATA ACQUISITION; ELECTRONS; ENERGY RESOLUTION; KEV RANGE; OPERATIONAL AMPLIFIERS; PERFORMANCE; PERFORMANCE TESTING; READOUT SYSTEMS; SAMPLING; SIGNALS; VELOCITY
- Descriptors DEC
- AMPLIFIERS; DATA PROCESSING; ELECTRONIC EQUIPMENT; ELEMENTARY PARTICLES; ENERGY RANGE; EQUIPMENT; FERMIONS; LEPTONS; MATHEMATICAL LOGIC; PROCESSING; RESOLUTION; SEMICONDUCTOR DEVICES; TESTING
Optional Information
- Notes
- 11 figs., 1 tab., 9 refs.; http://dx.doi.org/10.1088/1674-1137/39/7/076101