Multi-state perpendicular remanence in Co/Pd multilayers

Co/Pd multilayers deposited on Si (1 1 1) by electron gun evaporation were investigated. The magnetization measurements indicated out-of-plane easy magnetization direction for the samples with small Co layer thickness. The normal-to-the-plane remanent magnetization curves of the sample with Co layer thickness of 4 A show four well-defined levels depending on the field strength and direction. Each of these levels can be obtained by applying a broad range of fields making them easily accessible, and the high field remanence levels are lower in intensity than the low field ones. This seems to be an effect of competing magnetic anisotropies of different nature present in the samples. The coercive and switching fields, the remanence and all others technological requirements may eventually be tailored for a proper high-density recording media