Published June 1996 | Version v1
Journal article

Optimization of x-ray sources for proximity lithography produced by a high average power Nd:glass lasera

  • 1. Lawrence Livermore National Laboratory, University of California, Livermore, California 94550 (United States)
  • 2. Laser Plasma Interaction Section, Military University of Technology, Institute of Optoelectronics, 01-489 Warsaw 49 (Poland)
  • 3. IBM Microelectronics, Hopewell Junction, New York 12533 (United States)
  • 4. AT ampersand T Bell Laboratories, Murray Hill, New Jersey 07974 (United States)

Description

We measured the conversion efficiency of laser pulse energy into keV x rays from a variety of solid planar targets and a Xe gas puff target irradiated using a high average power Nd:glass slab laser capable of delivering 13 ns full width at half-maximum pulses at up to 20 J at 1.053 μm and 12 J at 0.53 μm. Targets were chosen to optimize emission in the 10 endash 15 A wavelength band, including L-shell emission from materials with atomic numbers in the range Z=24 endash 30 and M-shell emission from Xe (Z=54). With 1.053 μm a maximum conversion of 11% into 2π sr was measured from solid Xe targets. At 0.527 μm efficiencies of 12%endash 18%/(2π sr) were measured for all of the solid targets in the same wavelength band. The x-ray conversion efficiency from the Xe gas puff target was considerably lower, at about 3%/(2π sr) when irradiated with 1.053 μm. copyright 1996 American Institute of Physics

Additional details

Publishing Information

Journal Title
Journal of Applied Physics
Journal Volume
79
Journal Issue
11
Journal Page Range
p. 8258-8268.
ISSN
0021-8979
CODEN
JAPIAU