EDGE Thomson scattering diagnostic on Alcator C-Mod
- 1. MIT, Plasma Science and Fusion Center, Cambridge (United States)
Description
A high resolution edge Thomson scattering diagnostic is used in the Alcator C-Mod tokamak to study spatial structure of the edge plasma, with emphasis on the investigation of the edge transport barrier that forms in high confinement mode (H mode) of tokamak operation. The diagnostic employs a 30 Hz Nd:YAG laser (1.5 J, 8 nsec pulses) and a four spectral channel filter polychromator. Twenty scattering volumes, defined by collection optics geometry, span the region of the transport barrier, providing measurements of the electron density and temperature profiles with ∼1.5 mm spatial resolution. The system is capable of measuring values of Te between 15 eV and 800 eV, and covers the electron density range from 3x1019 m-3 to 5x1020 m-3. (author)
Additional details
Publishing Information
- Imprint Title
- Proceedings of the 10th international symposium on laser-aided plasma diagnostics
- Imprint Pagination
- 542 p.
- Journal Page Range
- p. 407-412
Conference
- Title
- 10. international symposium on laser-aided plasma diagnostics
- Dates
- 24-28 Sep 2001
- Place
- Fukuoka (Japan)
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 35014776
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- ALCATOR DEVICE; ELECTRON TEMPERATURE; LASER RADIATION; NEODYMIUM LASERS; OPTICAL SYSTEMS; PLASMA DENSITY; PLASMA SCRAPE-OFF LAYER; SENSITIVITY; SPATIAL DISTRIBUTION; SPATIAL RESOLUTION; SPECTRAL RESPONSE; THOMSON SCATTERING
- Descriptors DEC
- BOUNDARY LAYERS; CLOSED PLASMA DEVICES; DISTRIBUTION; ELECTROMAGNETIC RADIATION; INELASTIC SCATTERING; LASERS; LAYERS; RADIATIONS; RESOLUTION; SCATTERING; SOLID STATE LASERS; THERMONUCLEAR DEVICES; TOKAMAK DEVICES
Optional Information
- Notes
- 7 refs., 4 figs. Imprint:Local Organizers: Muraoka, K.; Maeda, M.; Mase, A.; Okada, T.; Uchino, K.; Kajiwara, T.; Yamagata, Y. and Teii, K.