Published September 1997
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Ultrasound investigation of inhomogeneity in irradiated silicon
- 1. AN RU, Tashkent (Uzbekistan). Inst. Yadernoj Fiziki
Description
Submicroscopic inhomogeneity in single and polycrystalline silicon samples as well as their behavior after X-ray irradiation were investigated by means by ultrasound resonance. The shape and orientation of the inhomogeneity was not changed after X-ray irradiation but their concentration increased. (A.A.D.)
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Additional details
Publishing Information
- Imprint Title
- Abstracts of the second Uzbekistan conference on modern problems of nuclear physics
- Imprint Pagination
- 196 p.
- Journal Page Range
- p. 145.
- Report number
- INIS-UZ--040
Conference
- Title
- 2. Uzbekistan conference on modern problems of nuclear physics.
- Dates
- 9-12 Sep 1997.
- Place
- Samarkand (Uzbekistan).
INIS
- Country of Publication
- Uzbekistan
- Country of Input or Organization
- Uzbekistan
- INIS RN
- 29000639
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CRYSTAL-PHASE TRANSFORMATIONS; HARD X RADIATION; PHYSICAL RADIATION EFFECTS; SILICON; ULTRASONIC TESTING
- Descriptors DEC
- ACOUSTIC TESTING; ELECTROMAGNETIC RADIATION; ELEMENTS; IONIZING RADIATIONS; MATERIALS TESTING; NONDESTRUCTIVE TESTING; PHASE TRANSFORMATIONS; RADIATION EFFECTS; RADIATIONS; SEMIMETALS; TESTING; X RADIATION