Published 2010
| Version v1
Miscellaneous
Open
X-ray analysis of VO2 textured thin films
Creators
- 1. Universidade Federal de Santa Maria (UFSM), RS (Brazil)
Description
no abstract available
Files
41109168.pdf
Files
(48.6 kB)
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Additional details
Publishing Information
- Imprint Pagination
- [1 p.]
- Report number
- INIS-BR--7528
Conference
- Title
- 33. Brazilian national meeting on condensed matter physics
- Original Conference Title
- 33. Encontro nacional de fisica da materia condensada
- Dates
- 10-14 May 2010
- Place
- Aguas de Lindoia, SP (Brazil)
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 41109168
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- No Abstract, Conference
- Descriptors DEI
- CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; CRYSTALS; VANADIUM; VANADIUM OXIDES; X RADIATION; X-RAY DIFFRACTION; X-RAY SPECTRA; X-RAY SPECTROSCOPY
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELEMENTS; IONIZING RADIATIONS; METALS; OXIDES; OXYGEN COMPOUNDS; RADIATIONS; SCATTERING; SPECTRA; SPECTROSCOPY; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS; VANADIUM COMPOUNDS