Published December 15, 2011 | Version v1
Journal article

Chemical speciation of chlorine in particulate matter by wavelength-dispersive PIXE technique

  • 1. Research Laboratory for Nuclear Reactors, Tokyo Institute of Technology, 2-12-1-N1-14, Ookayama, Meguro-ku, Tokyo 152-8550 (Japan)

Description

Chemical speciation of chlorine (Cl) in atmospheric particulate matter (APM) was performed by using a wavelength-dispersive PIXE spectrograph based on high-resolution measurement of Cl-Kβ emission. Samples of atmospheric particles were size-fractioned and collected by a cascade impactor at an urban area in Tokyo. The target position with respect to the spectrograph was precisely adjusted by a 2D laser displacement sensor to achieve high detection efficiency. The samples were irradiated with 2 MeV protons from a tandem electrostatic accelerator. The beam current was 300–500 nA. During the irradiation, the target was cooled by liquid nitrogen to avoid the evaporation of volatile Cl compounds. The measured spectra for the NaCl standard samples clearly showed the Cl-Kβ series composed of the Kβ1 and the satellite Kβx, Kβ5 lines. From the measured X-ray yields, it was found that the chemical speciation of samples with Cl concentrations as low as ≈1% is possible by this method. The Cl-Kβ series were also successfully observed in the case of APM samples with particle sizes of 11.0–2.1 μm. The spectra shapes of the NaCl standard samples and an APM sample were slightly different from each other, because of some possible mixing of non-sea salt component in the APM sample.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2011.04.083

Additional details

Identifiers

DOI
10.1016/j.nimb.2011.04.083;
PII
S0168-583X(11)00434-4;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
269
Journal Issue
24
Journal Page Range
p. 3111-3114
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
10. European conference on accelerators in applied research and technology
Acronym
ECAART10
Dates
13-17 Sep 2010
Place
Athens (Greece)

Optional Information

Copyright
Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.