Published 1995 | Version v1
Report

Generation of frequency-chirped optical pulses with felix

  • 1. FOM-Institute for Plasma Physics, Nieuwegein (Netherlands)

Description

Frequency-chirped optical pulses have been produced in the picosecond regime by varying the energy of the electron beam on a microsecond time scale. These pulses were then compressed close to their bandwidth limit by an external pulse compressor. The amount of chirp can be controlled by varying the sweep rate on the electron beam energy and by cavity desynchronisation. To examine the generated chirp we used the following diagnostics: a pulse compressor, a crossed beam autocorrelator, a multichannel electron spectrometer and multichannel optical spectrometer. The compressor is build entirely using reflective optics to permit broad band operation. The autocorrelator is currently operating from 6 μm to 30 μm with one single crystal. It has been used to measure pulses as short as 500 fs. All diagnostics are evacuated to prevent pulse shape distortion or pulse lengthening caused by absorption in ambient water vapour. Pulse length measurements and optical spectra will be presented for different electron beam sweep rates, showing the presence of a frequency chirp. Results on the compression of the optical pulses to their bandwidth limit are given for different electron sweep rates. More experimental results showing the dependence of the amount of chirp on cavity desynchronisation will be presented

Additional details

Publishing Information

Imprint Title
17th international free electron laser conference and 2nd international FEL users' workshop. Program and abstracts
Imprint Pagination
300 p.
Journal Page Range
p. Mo4.1.
Report number
BNL--61982-Absts

Conference

Title
17. international free electron laser conference; 2. international FEL users' workshop.
Dates
21-25 Aug 1995.
Place
New York, NY (United States).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
27062438
Subject category
S43: PARTICLE ACCELERATORS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BEAM MONITORING; ELECTRON BEAMS; FREE ELECTRON LASERS; PULSE TECHNIQUES; SPECTROMETERS
Descriptors DEC
AMPLIFIERS; BEAMS; EQUIPMENT; LASERS; LEPTON BEAMS; MEASURING INSTRUMENTS; MONITORING; PARTICLE BEAMS

Optional Information

Secondary number(s)
CONF-9508156--Absts.