Published December 1999 | Version v1
Book

Sensitivity of TLD chips (LiF) at different annealing temperatures

Creators

  • 1. Nuclear Science Centre, New Delhi (India)

Description

Thermo-luminescent dosimetry (TLD) is well accepted method for measuring radiation dose. In this technique a TLD chip (3 x 3 x 0.4 mm) is exposed to radiation (from neutron or gamma activation) for a stipulated time. Initially the chip is heated to a temperature (anneal temperature) to remove residual activity present from previous exposure. The purpose of this work is to identify the range of anneal temperature where the sensitivity of TLD chip, measured in terms of light output is optimum

Part of:
DAE symposium on nuclear physics: contributed papers. V. 42B

Additional details

Publishing Information

Publisher
Bhabha Atomic Research Centre
Imprint Place
Mumbai (India)
Imprint Title
DAE symposium on nuclear physics: contributed papers. V. 42B
Imprint Pagination
505 p.
Journal Page Range
p. 398-399

Conference

Title
DAE symposium on nuclear physics
Dates
27-31 Dec 1999
Place
Chandigarh (India)

Optional Information

Notes
3 refs., 1 fig.