A new certified reference material for size analysis of nanoparticles
Creators
- 1. Institute for Reference Materials and Measurements (IRMM), European Commission, Joint Research Centre (Belgium)
Description
A certified reference material, ERM-FD100, for quality assurance and validation of various nanoparticle sizing methods, was developed by the Institute for Reference Materials and Measurements. The material was prepared from an industrially sourced colloidal silica containing nanoparticles with a nominal equivalent spherical diameter of 20 nm. The homogeneity and stability of the candidate reference material was assessed by means of dynamic light scattering and centrifugal liquid sedimentation. Certification of the candidate reference material was based on a global interlaboratory comparison in which 34 laboratories participated with various analytical methods (DLS, CLS, EM, SAXS, ELS). After scrutinising the interlaboratory comparison data, 4 different certified particle size values, specific for the corresponding analytical method, could be assigned. The good comparability of results allowed the certification of the colloidal silica material for nanoparticle size analysis.
Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Nanoparticle Research
- Journal Volume
- 14
- Journal Issue
- 9
- Journal Page Range
- p. 1-12
- ISSN
- 1388-0764
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44036588
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CALIBRATION STANDARDS; CERTIFICATION; INTERLABORATORY COMPARISONS; LIGHT SCATTERING; LIQUIDS; NANOSTRUCTURES; PARTICLE SIZE; QUALITY ASSURANCE; SEDIMENTATION; SILICA; SMALL ANGLE SCATTERING; STABILITY; VALIDATION; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; FLUIDS; MINERALS; OXIDE MINERALS; SCATTERING; SIZE; STANDARDS; TESTING
Optional Information
- Copyright
- Copyright (c) 2012 Springer Science+Business Media B.V.