Published December 1991
| Version v1
Journal article
The on-orbit measurements of single event phenomena by ETS-V spacecraft
Creators
- 1. High-Reliability Components Corp., 2-5-8 Daimon, Minato-ku, Tokyo (Japan)
- 2. National Space Development Agency, Tokyo (Japan)
Description
This paper reports on the on-orbit data of single event phenomena which were obtained for the CMOS static RAMs equipped in Engineering Test Satellite-V (ETS-V) in a geostationary orbit. The single event latchup and single event upset data were acquired for a period of about 3 years, and the effects of solar flares were observed. A comparison with the data (single event upset) of TTL SRAMs by Marine Observation Satellite-1 (MOS-1: a medium-altitude satellite) was also conducted. The Poisson distribution and the extreme-value theory (doubly exponential distribution) were adopted to analyze the data. From this analysis a decrease of the number of single events could be found during the solar maximum
Additional details
Publishing Information
- Journal Title
- IEEE Transactions on Nuclear Science
- Journal Volume
- 38
- Journal Issue
- 6
- Series
- IEEE Trans. Nucl. Sci.
- Journal Page Range
- 1693-1699
- ISSN
- 0018-9499
- CODEN
- IETNA
Conference
- Title
- Institute of Electrical and Electronic Engineers (IEEE) annual international nuclear and space radiation effects conference.
- Dates
- 15-19 Jul 1991.
- Place
- San Diego, CA (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 23042685
- Subject category
- S58: GEOSCIENCES;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COMPARATIVE EVALUATIONS; DATA ANALYSIS; DISTRIBUTION; POISSON EQUATION; RADIATION EFFECTS; SATELLITES; SOLAR FLARES; SUDDEN COMMENCEMENTS
- Descriptors DEC
- DIFFERENTIAL EQUATIONS; EQUATIONS; EVALUATION; PARTIAL DIFFERENTIAL EQUATIONS; SOLAR ACTIVITY; STELLAR ACTIVITY; STELLAR FLARES
Optional Information
- Secondary number(s)
- CONF-910751--.