Published 2011 | Version v1
Book

Effect of praseodymium incorporation on the structural and optical properties of ZnO thin films by RF magnetron sputtering

  • 1. Department of Optoelectronics, University of Kerala, Thiruvananthapuram (India)

Description

In order to study the effect of praseodymium doping, thin films of ZnO and praseodymium doped ZnO (1, 3 and 5 wt %) were prepared by RF Magnetron Sputtering and the structural and optical properties are investigated by X-ray diffraction, SEM, atomic force microscopy, UV-Visible spectroscopy and photoluminescence spectroscopy. All the films posses a hexagonal Wurtzite crystal structure with preferred orientation along (002) direction. The SEM images of the doped films show a porous structure for the films. From the PL spectra all the films shows emission in the UV and visible region. The UV emission of the near band edge is due to free exciton recombination and the other is the deep-level emission in the visible region. (author)

Part of:
Proceedings of the thirty fifth international conference on contemporary trends in optics and optoelectronics: conference digest - extended abstracts

Additional details

Publishing Information

Publisher
Indian Institute of Space Science and Technology
Imprint Place
Thiruvananthapuram (India)
Imprint Title
Proceedings of the thirty fifth international conference on contemporary trends in optics and optoelectronics: conference digest - extended abstracts
Imprint Pagination
617 p.
Journal Page Range
p. 529-530

Conference

Title
35. Optical Society of India symposium
Dates
17-19 Jan 2011
Place
Thiruvananthapuram (India)

INIS

Country of Publication
India
Country of Input or Organization
India
INIS RN
44022267
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BAND THEORY; CRYSTAL DOPING; CRYSTAL STRUCTURE; PRASEODYMIUM; SCANNING ELECTRON MICROSCOPY; SPUTTERING; THIN FILMS; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; FILMS; METALS; MICROSCOPY; RARE EARTHS; SCATTERING

Optional Information

Notes
3 refs., 4 figs.