Influence of initial amorphous structure on the in-situ crystallization of metastable thin films
Creators
- 1. SLAC National Accelerator Laboratory, CA (United States)
- 2. National Renewable Energy Laboratory (United States)
- 3. Harvard University (United States)
- 4. Lawrence Berkeley National Laboratory (United States)
Description
Full text: Many technologically relevant materials are in fact kinetically stabilized and not at their true thermodynamic free energy minimum, i.e., they are metastable. These kinetically stabilized materials can show improved functionality over their thermodynamically stable counterparts. However, it is difficult at best to predict formation pathways for such metastable materials. In this work, we aim to understand how the initial state of amorphous thin films of VOx influences the final crystalline form or polymorph. We employ a range of synchrotron based techniques: grazing incidence pair distribution function (GIPDF), x-ray absorption spectroscopy (XAS), and x-ray diffraction (XRD) during in-situ crystallization. We focus on amorphous VOx films deposited by pulsed laser deposition with varying laser repetition rates and oxygen partial pressures and subsequently crystallized by annealing under different conditions. These different synthesis conditions create several different amorphous structures, as identified from GIPDF and XAS analysis. In-situ 2D-XRD during film crystallization shows that the different starting amorphous structures result in the formation of different polymorph. We use these results to relate the local structure of the initial amorphous structures to the VOx polymorph structure. This work is part of a larger effort to help better understand the pathways needed to synthesize different polymorph. (author)
Availability note (English)
Available in abstract form only; full text entered in this recordAdditional details
Publishing Information
- Imprint Pagination
- 1 p.
Conference
- Title
- 14. Brazil MRS meeting
- Dates
- 27 Sep - 1 Oct 2015
- Place
- Rio de Janeiro, RJ (Brazil)
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 49081786
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- AMORPHOUS STATE; ANNEALING; CRYSTALLIZATION; SYNTHESIS; THIN FILMS; VANADIUM; X-RAY DIFFRACTION; X-RAY SPECTROSCOPY
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELEMENTS; FILMS; HEAT TREATMENTS; METALS; PHASE TRANSFORMATIONS; SCATTERING; SPECTROSCOPY; TRANSITION ELEMENTS