Influence of silicon addition on intercritical annealing process and tensile properties of medium Mn steel
Creators
- 1. Inner Mongolia University of Science and Technology. Bayan Obo Multi-Metallic Resource Comprehensive Utilization Key Laboratory (China)
- 2. Inner Mongolia University of Science and Technology. School of Material and Metallurgy (China)
Description
This paper presents research on the equilibrium phase fractions, microstructure, and tensile properties of a 0.2C–5Mn–1.5Al (mass %) steel with 0 or 0.5 (mass %) Si addition after intercritical annealing (IA), using thermodynamic simulation, scanning electron microscopy, transmission electron microscopy, X-ray diffractometry, and uniaxial tensile testing. The research results show that the addition of 0.5 Si (mass %) has no significant effect on the equilibrium phase fraction but influences the optimal IA temperature. Different IA temperatures result in the retained austenite having different morphologies. The retained austenite in the 730 °C sample (0.5 Si) has two different morphologies—polygonal and lath—while the 760 °C sample (0 Si) has only polygonal retained austenite. The optimal tensile properties of the 0.5 Si steel are better than those of the 0 Si steel due to the solution strengthening effect of Si and the higher stability of retained austenite. The tensile properties of the investigated 0.5 Si steel are excellent, with a tensile strength of over 1 GPa, elongation over 42.00%, and strength × ductility over 42 GPa%.
Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Materials Science
- Journal Volume
- 56
- Journal Issue
- 2
- Journal Page Range
- p. 1783-1793
- ISSN
- 0022-2461
- CODEN
- JMTSAS
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 55075812
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANNEALING; AUSTENITE; DUCTILITY; ELONGATION; MANGANESE STEELS; MICROSTRUCTURE; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY; SILICON; SILICON ADDITIONS; STABILITY; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION; YIELD STRENGTH
- Descriptors DEC
- ALLOYS; CARBON ADDITIONS; COHERENT SCATTERING; DEFORMATION; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; HEAT TREATMENTS; IRON ALLOYS; IRON BASE ALLOYS; MANGANESE ALLOYS; MECHANICAL PROPERTIES; MICROSCOPY; SCATTERING; SEMIMETALS; SILICON ALLOYS; STEELS; TENSILE PROPERTIES; TRANSITION ELEMENT ALLOYS
Optional Information
- Copyright
- Copyright (c) 2020 © Springer Science+Business Media, LLC, part of Springer Nature 2020