Published August 1, 1979
| Version v1
Journal article
The well depths of XeF- and XeCl- from differential scattering measurements
- 1. FOM-Instituut voor Atoom-en Molecuulfysica, Amsterdam (Netherlands)
Description
Elastic differential cross section measurements were performed for F- + Xe and Cl- + Xe in an energy range of 250-500 eV and in an angular range of 0-6 mrad. In contrast to the case of Cl- on Xe, the rainbow structure in the cross section for F- on Xe was well resolved. From the measurements the well depth of XeF- has been determined to be 0.28 +- 0.04 eV, while for XeCl- the well depth should be less than 0.14 eV. (Auth.)
Additional details
Publishing Information
- Journal Title
- Chem. Phys. Lett.
- Journal Volume
- 65
- Journal Issue
- 1
- Series
- Chem. Phys. Lett.
- Journal Page Range
- 93-94
- ISSN
- 0009-2614
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 11503495
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- ANIONS; DIFFERENTIAL CROSS SECTIONS; ELASTIC SCATTERING; EV RANGE 100-1000; FLUORINE IONS; ION-ATOM COLLISIONS; MOLECULAR IONS; XENON; XENON FLUORIDES
- Descriptors DEC
- ATOM COLLISIONS; CHARGED PARTICLES; COLLISIONS; CROSS SECTIONS; ELEMENTS; ENERGY RANGE; EV RANGE; FLUORIDES; FLUORINE COMPOUNDS; HALIDES; HALOGEN COMPOUNDS; ION COLLISIONS; IONS; NONMETALS; RARE GAS COMPOUNDS; RARE GASES; SCATTERING; XENON COMPOUNDS