Published June 22, 1999 | Version v1
Patent

Application accelerator system having bunch control

Description

An application accelerator system for monitoring the gain of a free electron laser is disclosed. Coherent Synchrotron Radiation (CSR) detection techniques are used with a bunch length monitor for ultra short, picosec to several tens of femtosec, electron bunches. The monitor employs an application accelerator, a coherent radiation production device, an optical or beam chopping device, an infrared radiation collection device, a narrow-banding filter, an infrared detection device, and a control. 1 fig

Availability note (English)

Available from Patent and Trademark Office, Box 9, Washington, DC 20232 (United States)

Additional details

Publishing Information

Imprint Pagination
[10 p.]
IPC:
Int. Cl. H05H 7/00; G21K 1/00
IPC
Int. Cl. H05H 7/00; G21K 1/00
Patent number
US patent document 5,914,492/A/

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
30053706
Subject category
S43: PARTICLE ACCELERATORS;
Resource subtype / Literary indicator
Non-conventional Literature
Descriptors DEI
ACCELERATORS; COHERENT RADIATION; DESIGN; DIAGNOSTIC TECHNIQUES; FREE ELECTRON LASERS; GAIN; INFRARED RADIATION; OPTICAL SYSTEMS; SYNCHROTRON RADIATION; USES
Descriptors DEC
AMPLIFICATION; BREMSSTRAHLUNG; ELECTROMAGNETIC RADIATION; LASERS; RADIATIONS

Optional Information