Crack Detection Using EddyTherm
Creators
- 1. MTU Aero Engines, D-80995 Munich (Germany)
Description
The EddyTherm thermographic crack detection method uses brief pulsed eddy currents to heat metallic components under inspection. Cracks, if present, will disturb the current flow and so generate changes in the temperature profile in the crack area. These temperature changes are visualized using a thermographic camera. The advantages afforded by the method are its very brief inspection times, its ability to inspect complex geometries, its excellent flaw detection sensitivity and its ability to detect hidden, subsurface cracks. Simulation of inductive heating using FEM methods permits coils to be adjusted and inspection parameters optimized. The use of a robot to manipulate parts under inspection, a high-frequency pulse generator for inductive heating and enhanced algorithms enabled a demonstrator to be set up for the fully automated crack inspection of engine compressor blades
Additional details
Identifiers
- DOI
- 10.1063/1.1916868;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 760
- Journal Issue
- 1
- Journal Page Range
- p. 1646-1653
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- Conference on review of progress in quantitative nondestructive evaluation
- Dates
- 25-30 Jul 2004
- Place
- Golden, CO (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36094966
- Subject category
- S42: ENGINEERING;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALGORITHMS; CAMERAS; COMPRESSOR BLADES; CRACKS; DEFECTS; DETECTION; EDDY CURRENT TESTING; EDDY CURRENTS; ENGINES; FINITE ELEMENT METHOD; HEATING; INSPECTION; METALS; PULSE GENERATORS; ROBOTS; SENSITIVITY; SIMULATION
- Descriptors DEC
- CALCULATION METHODS; CURRENTS; ELECTRIC CURRENTS; ELECTROMAGNETIC TESTING; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FUNCTION GENERATORS; MATERIALS TESTING; MATHEMATICAL LOGIC; MATHEMATICAL SOLUTIONS; NONDESTRUCTIVE TESTING; NUMERICAL SOLUTION; TESTING
Optional Information
- Notes
- (c) 2005 American Institute of Physics