Published April 15, 1981
| Version v1
Journal article
Defect trapping of gas atoms in metals
Description
Ion implantation provides a way to controllably introduce both defects and gas atoms into metals. This paper reviews implantation studies of the trapping of hydrogen and helium by simple defects in metals. In particular, the increasingly strong evidence for the role of vacancies as trap centers is examined. Interpreted trap structures and binding energies are summarized. Related effects for lighter particles of elementary charge (muons) and heavier inert gases (Xe) are discussed. (orig.)
Additional details
Publishing Information
- Journal Title
- Nucl. Instrum. Methods
- Journal Volume
- 182/183
- Journal Issue
- pt.1
- Series
- Nucl. Instrum. Methods.
- Journal Page Range
- 413-437
- ISSN
- 0029-554X
Conference
- Title
- 2. international conference on ion beam modification of materials.
- Dates
- 14 - 18 Jul 1980.
- Place
- Albany, NY, USA.
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 12630583
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference, Progress Report
- Descriptors DEI
- BINDING ENERGY; CRYSTAL DEFECTS; HELIUM; HYDROGEN; ION IMPLANTATION; MUONS; TRAPPING; VACANCIES; XENON
- Descriptors DEC
- CRYSTAL STRUCTURE; ELEMENTARY PARTICLES; ELEMENTS; ENERGY; FERMIONS; LEPTONS; NONMETALS; POINT DEFECTS; RARE GASES