Published December 2004 | Version v1
Journal article

Dedicated Max-Planck beamline for the in situ investigation of interfaces and thin films

  • 1. Max-Planck-Institut fuer Metallforschung, Heisenbergstrasse 3, D-70569 Stuttgart (Germany)

Description

A dedicated beamline for the Max-Planck-Institut fuer Metallforschung was recently taken into operation at the Angstroemquelle Karlsruhe (ANKA). Here we describe the layout of the beamline optics and the experimental end-station, consisting of a heavy duty multiple circle diffractometer. For both a new design was realized, combining a maximum flexibility in the beam properties [white, pink (focused) monochromatic, energy range 6-20 keV] with a special diffractometer for heavy sample environments up to 500 kg, that can be run in different geometrical modes. In addition the angular-reciprocal space transformations for the diffractometer in use are derived, which allows an operation of the instrument in the convenient six circle mode. As an example, results from surface x-ray diffraction on a Cu3Au(111) single crystal are presented

Additional details

Identifiers

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
75
Journal Issue
12
Journal Page Range
p. 5302-5307
ISSN
0034-6748
CODEN
RSINAK

Optional Information

Notes
(c) 2004 American Institute of Physics