Published March 15, 2011 | Version v1
Journal article

Development of Y3+ and Mg2+-doped zirconia thick film humidity sensors

  • 1. School of Electronic Science and Technology, Dalian University of Technology, Dalian 116023 (China)
  • 2. School of Information and Communication Engineering, Dalian University of Technology, Dalian 116023 (China)

Description

Research highlights: → Y3+ doped and Mg2+ doped zirconia thick film humidity sensors were developed. → The sensors exhibited high sensitivity, good linearity and small hysteresis. → Rapid response-recovery behavior and less effect of temperature were also exhibited. → The influence of dopant on the sensors was discussed by XRD, XPS and defect structure. → The humidity sensing mechanism is investigated. - Abstract: Y3+-doped and Mg2+-doped zirconia thick film humidity sensors were investigated. The humidity sensors exhibited good sensing characteristics. The sensor got a high sensitivity with the impedance changed five orders of magnitude from 108 to 103 Ω in the relative humidity (RH) range of 11-98% at 20 deg. C. The response time is about 30 s for Y3+ doped sensor, and 5 s for Mg2+ doped one, and recovery time is 5 s for both sensors. Small humidity hysteresis is about 3% RH and 4% RH for Y3+ and Mg2+ doped ZrO2 sensors, respectively. Moreover, good repeatability, linearity and temperature properties of the both sensors were also exhibited. X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS) and defect structure were used to analyze the influence of dopant on humidity sensitive properties. And the mechanism of humidity sensing properties was also discussed.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.matchemphys.2010.12.034

Additional details

Identifiers

DOI
10.1016/j.matchemphys.2010.12.034;
PII
S0254-0584(10)00997-1;

Publishing Information

Journal Title
Materials Chemistry and Physics
Journal Volume
126
Journal Issue
1-2
Journal Page Range
p. 31-35
ISSN
0254-0584
CODEN
MCHPDR

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.