Direct determination of electrical conductivity of oxide cathodes
Creators
Description
The application range of oxide cathodes, e.g. in CRTs is limited by the critical dc current density (typically 1-3 A/cm2) and hence by the electrical conduction mechanism. The electrical conductivity σel of the oxide layer has now been determined directly in a new procedure in a close-spaced planar diode configuration in an UHV chamber, together with thermionic emission data. The cathode temperature measured as a function of continuous dc load is essentially the result of a superposition of electron emission cooling--proportional to the dc current--and ohmic heating proportional to the square of the dc current. At the compensation point between electron emission cooling and ohmic heating, σel can be determined directly from the emission data. After activation a result of about 10-2 (Ω cm)-1 at 780 deg.C true temperature is obtained for BaSr-oxide cathodes, which is consistent with literature. It is shown that electrical conductivity decreases with operating time in accordance with reduced Ba generation. σel can be increased by oxide dopants like yttria or europia
Additional details
Identifiers
- PII
- S0169433202002519;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 201
- Journal Issue
- 1-4
- Journal Page Range
- p. 35-40
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38062498
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CATHODES; COOLING; CURRENT DENSITY; DOPED MATERIALS; ELECTRIC CONDUCTIVITY; ELECTRON EMISSION; LAYERS; RARE EARTHS; SEMICONDUCTOR MATERIALS; THERMIONIC EMISSION; YTTRIUM OXIDES
- Descriptors DEC
- CHALCOGENIDES; ELECTRICAL PROPERTIES; ELECTRODES; ELEMENTS; EMISSION; MATERIALS; METALS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; TRANSITION ELEMENT COMPOUNDS; YTTRIUM COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2002 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.