Published February 19, 2007
| Version v1
Journal article
Duality and defects in rational conformal field theory
- 1. Institut fuer Theoretische Physik, ETH Zuerich, CH-8093 Zurich (Switzerland)
- 2. Avdelning Fysik, Karlstads Universitet, Universitetsgatan 5, S-651 88 Karlstad (Sweden)
- 3. Department of Mathematics, King's College London, Strand, London WC2R 2LS (United Kingdom)
- 4. Organisationseinheit Mathematik, Universitaet Hamburg, Schwerpunkt Algebra und Zahlentheorie and Zentrum fuer Mathematische Physik, Bundesstrasse 55, D-20 146 Hamburg (Germany)
Description
We study topological defect lines in two-dimensional rational conformal field theory. Continuous variation of the location of such a defect does not change the value of a correlator. Defects separating different phases of local CFTs with the same chiral symmetry are included in our discussion. We show how the resulting one-dimensional phase boundaries can be used to extract symmetries and order-disorder dualities of the CFT. The case of central charge c=4/5, for which there are two inequivalent world sheet phases corresponding to the tetra-critical Ising model and the critical three-states Potts model, is treated as an illustrative example
Additional details
Identifiers
- DOI
- 10.1016/j.nuclphysb.2006.11.017;
- arXiv
- arXiv:hep-th/0607247v2;
- PII
- S0550-3213(06)00918-7;
Publishing Information
- Journal Title
- Nuclear Physics. B
- Journal Volume
- 763
- Journal Issue
- 3
- Journal Page Range
- p. 354-430
- ISSN
- 0550-3213
- CODEN
- NUPBBO
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39027349
- Subject category
- S72: PHYSICS OF ELEMENTARY PARTICLES AND FIELDS;
- Descriptors DEI
- CHIRAL SYMMETRY; CONFORMAL INVARIANCE; DUALITY; ISING MODEL; ONE-DIMENSIONAL CALCULATIONS; QUANTUM FIELD THEORY; TOPOLOGY; TWO-DIMENSIONAL CALCULATIONS
- Descriptors DEC
- CRYSTAL MODELS; FIELD THEORIES; INVARIANCE PRINCIPLES; MATHEMATICAL MODELS; MATHEMATICS; SYMMETRY
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.