Published February 19, 2007 | Version v1
Journal article

Duality and defects in rational conformal field theory

  • 1. Institut fuer Theoretische Physik, ETH Zuerich, CH-8093 Zurich (Switzerland)
  • 2. Avdelning Fysik, Karlstads Universitet, Universitetsgatan 5, S-651 88 Karlstad (Sweden)
  • 3. Department of Mathematics, King's College London, Strand, London WC2R 2LS (United Kingdom)
  • 4. Organisationseinheit Mathematik, Universitaet Hamburg, Schwerpunkt Algebra und Zahlentheorie and Zentrum fuer Mathematische Physik, Bundesstrasse 55, D-20 146 Hamburg (Germany)

Description

We study topological defect lines in two-dimensional rational conformal field theory. Continuous variation of the location of such a defect does not change the value of a correlator. Defects separating different phases of local CFTs with the same chiral symmetry are included in our discussion. We show how the resulting one-dimensional phase boundaries can be used to extract symmetries and order-disorder dualities of the CFT. The case of central charge c=4/5, for which there are two inequivalent world sheet phases corresponding to the tetra-critical Ising model and the critical three-states Potts model, is treated as an illustrative example

Additional details

Identifiers

DOI
10.1016/j.nuclphysb.2006.11.017;
arXiv
arXiv:hep-th/0607247v2;
PII
S0550-3213(06)00918-7;

Publishing Information

Journal Title
Nuclear Physics. B
Journal Volume
763
Journal Issue
3
Journal Page Range
p. 354-430
ISSN
0550-3213
CODEN
NUPBBO

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39027349
Subject category
S72: PHYSICS OF ELEMENTARY PARTICLES AND FIELDS;
Descriptors DEI
CHIRAL SYMMETRY; CONFORMAL INVARIANCE; DUALITY; ISING MODEL; ONE-DIMENSIONAL CALCULATIONS; QUANTUM FIELD THEORY; TOPOLOGY; TWO-DIMENSIONAL CALCULATIONS
Descriptors DEC
CRYSTAL MODELS; FIELD THEORIES; INVARIANCE PRINCIPLES; MATHEMATICAL MODELS; MATHEMATICS; SYMMETRY

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.