Published March 2001
| Version v1
Journal article
Charge Carrier Dynamics in Zn-Doped Cuprates
Creators
- 1. Technische Universitaet Braunschweig, Institut fuer Metallphysik und Nukleare Festkoerperphysik (Germany)
- 2. Universitaet zu Koeln, II. Physikalisches Institut (Germany)
Description
We have measured the static magnetic susceptibility, the resistivity and muon spin relaxation (μ+SR) spectra of Zn and Sr doped La2CuO2. Our data show that non-magnetic Zn impurities lead to an increase of the Neel temperature TN in weakly hole doped compounds. This increase of TN correlates with an increase of the resistivity. The analysis of our data strongly suggests that the hole mobility is the most important source for the strong suppression of long range antiferromagnetic order in La2-xSrxCuO4
Additional details
Identifiers
Publishing Information
- Journal Title
- Hyperfine Interactions
- Journal Volume
- 133
- Journal Issue
- 1-4
- Journal Page Range
- p. 203-206
- ISSN
- 0304-3843
- CODEN
- HYINDN
Conference
- Title
- International conference on nuclear methods in magnetism
- Acronym
- NMM2000
- Dates
- 2-4 Aug 2000
- Place
- Rio de Janeiro (Brazil)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40085598
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANTIFERROMAGNETISM; CHARGE CARRIERS; CUPRATES; DOPED MATERIALS; HOLE MOBILITY; HOLES; IMPURITIES; INHIBITION; MAGNETIC SUSCEPTIBILITY; MUON SPIN RELAXATION; MUONS PLUS; NEEL TEMPERATURE; SPECTRA
- Descriptors DEC
- ANTILEPTONS; ANTIMATTER; ANTIPARTICLES; COPPER COMPOUNDS; ELEMENTARY PARTICLES; FERMIONS; LEPTONS; MAGNETIC PROPERTIES; MAGNETISM; MATERIALS; MATTER; MOBILITY; MUONS; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RELAXATION; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENT COMPOUNDS; TRANSITION TEMPERATURE
Optional Information
- Copyright
- Copyright (c) 2001 Kluwer Academic Publishers