Determination of the stability of high-intensity electron beams at energies up to 20 keV with a precision of 0.1% by means of pin diodes

Published 2016 | Version v1

Journal article Metadata-only

no abstract available

Additional details

Original title (German): Bestimmung der Stabilitaet von Elektronenstrahlen hoher Intensitaet bei Energien bis zu 20 keV mit einer Praezision von 0,1% mit Hilfe von pin-Dioden

Journal Title: Verhandlungen der Deutschen Physikalischen Gesellschaft
Journal Issue: Hamburg 2016 issue
Series: Also available as printed version: Verhandlungen der Deutschen Physikalischen Gesellschaft v. 51(2)
Journal Page Range: [1 p.]
ISSN: 0420-0195
CODEN: VDPEAZ

Title: DPG-Fruehjahrstagung 2016 (Spring meeting) of the section matter and cosmos (SMuK) together with the divisions gravity and relativity, radiation and medical physics, particle physics, theoretical and mathematical physics, and the working group philosophy of physics
Original Conference Title: DPG-Fruehjahrstagung 2016 der Sektion Materie und Kosmos (SMuK) gemeinsam mit den Fachverbaenden Gravitation und Relativitaetstheorie, Strahlen- und Medizinphysik, Teilchenphysik, Theoretische und Mathematische Grundlagen der Physik sowie der Arbeitsgruppe Philosophie der Physik
Dates: 29 Feb - 4 Mar 2016
Place: Hamburg (Germany)

Country of Publication: Germany
Country of Input or Organization: Germany
INIS RN: 48019667
Subject category: S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator: Conference, No Abstract
Descriptors DEI: ACCURACY; BEAM DYNAMICS; BEAM MONITORING; DIGITAL COMPUTERS; ELECTRON BEAMS; ELECTRON DETECTION; JUNCTION DETECTORS; JUNCTION DIODES; KEV RANGE 10-100; PROCESS COMPUTERS; PULSE AMPLIFIERS; STABILITY
Descriptors DEC: AMPLIFIERS; BEAMS; CHARGED PARTICLE DETECTION; COMPUTERS; DETECTION; DYNAMICS; ELECTRONIC EQUIPMENT; ENERGY RANGE; EQUIPMENT; KEV RANGE; LEPTON BEAMS; MEASURING INSTRUMENTS; MECHANICS; MONITORING; PARTICLE BEAMS; RADIATION DETECTION; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES