Published October 12, 1992 | Version v1
Journal article

Induced anisotropy in amorphous Sm-Co sputtered films

  • 1. Physics Department, Queens College of CUNY, Flushing, New York 11367 (United States)

Description

The variation of the in-the-film-plane anisotropy constant, Ku, with composition and the magnitude of the field, Hs, applied in plane during the sputter deposition of amorphous SmxCo1-x, 0.08≤x≤0.40, thin films has been studied. We demonstrate here that with a large Hs, 5.0 kOe, a well defined and large in-the-film-plane anisotropy can be obtained. An exceptionally high value of Ku=3.3x106 erg/cm3 has been obtained. For the loop measured along the in-plane hard direction, the opening of the loop was undetectable, and the loop along the easy axis was a perfect rectangle. For certain conditions, the anisotropy field measured perpendicular to the film plane when corrected for demagnetization (Nd=4π) was the same as that for the in-plane measurements. It is concluded that surface induced short range ordering was the origin of the anisotropy observed in amorphous films deposited in a magnetic field. The formation mechanism is different from that of the short range ordering induced by field annealing

Additional details

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
61
Journal Issue
15
Journal Page Range
p. 1861-1863.
ISSN
0003-6951
CODEN
APPLAB