Published May 2009 | Version v1
Journal article

High-resolution electron energy loss spectroscopy as a probe of SAMs

  • 1. ITODYS - Interfaces, Traitements, Organisation et Dynamique des Systemes, Centre National de la Recherche Scientifique (CNRS), Universite Paris Diderot, 15, rue Jean de Baif, 75205 Paris Cedex 13 (France)
  • 2. CQFM - Centro de Quimica-Fisica Molecular and IN - Institute of Nanoscience and Nanotechnology, Technical University of Lisbon, Instituto Superior Tecnico, Avenida Rovisco Pais, 1049-001 Lisboa (Portugal)

Description

High-resolution electron energy loss spectroscopy (HREELS) as a probe of self-assembled monolayers (SAMs) obtained from thiols is here reviewed. It is shown how this surface selective spectroscopy can deliver information about these molecular hybrid systems. The layer ordering and organization into domains is probed through the analysis of the broadening of the elastic peak. Interfacial bonding between the thiol group and the substrate as well as the orientation of different parts of the grafted molecule is studied through the analysis of the vibrations induced by incident electrons interacting by dipolar mechanisms. The nature of outermost molecular groups exposed to the vacuum is inferred through the interactions by electron impact. HREELS spectra can provide additional information on interband transitions, excitation thresholds, the values of the gap and, besides, about intermolecular interactions. The interest of HREELS for studying strands of DNA ordered in SAMs, as models of DNA, is evinced.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.elspec.2009.02.002

Additional details

Identifiers

DOI
10.1016/j.elspec.2009.02.002;
PII
S0368-2048(09)00043-7;

Publishing Information

Journal Title
Journal of Electron Spectroscopy and Related Phenomena
Journal Volume
172
Journal Issue
1-3
Journal Page Range
p. 27-35
ISSN
0368-2048
CODEN
JESRAW

INIS

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.