Published June 2006 | Version v1
Journal article Metadata-only

Calibration of SIOM-5FW film in the range of 0.1-4 keV

Creators

  • 1. Laboratoire pour l'Utilisation des Lasers Intenses, UMR No 7605 CNRS, CEA, Ecole Polytechnique, Universite Paris VI, 91128 Palaiseau (France) and Faculty of Applied Mathematics and Physics, National Technical University of Athens, Iroon Polytechnelou St. 9, 15780 Athens (Greece)
  • 2. Centre d'Etudes DAM-Ile-de-France, 91680 Bruyeres-le-Chatel (France)
  • 3. Laboratoire pour l'Utilisation des Lasers Intenses, UMR No 7605 CNRS, CEA, Ecole Polytechnique, Universite Paris VI, 91128 Palaiseau (France)

Description

The SIOM-5FW film produced for the sub-keV x-ray detection range was calibrated here in a wide energy range (0.1-4 keV). A single set of parameters valid in the whole measured energy range was determined for the calibration of the Shangai 5F (SIOM-5FW) film from a parametric fit of the data. The sensitivity of the SIOM-5FW film was measured to be four times lower than that of the Kodak DEF film at 2.5 keV photon energy. Modeling of the DEF and SIOM-5FW films provides a good comparison of their sensitivity in the 0.1-10 keV range

Additional details

Identifiers

DOI
10.1063/1.2206987;

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
77
Journal Issue
6
Journal Page Range
p. 063503-063503.4
ISSN
0034-6748
CODEN
RSINAK

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38026277
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
CALIBRATION; COMPARATIVE EVALUATIONS; FILMS; KEV RANGE 01-10; PHOTONS; SENSITIVITY; SIMULATION; X-RAY DETECTION
Descriptors DEC
BOSONS; DETECTION; ELEMENTARY PARTICLES; ENERGY RANGE; EVALUATION; KEV RANGE; MASSLESS PARTICLES; RADIATION DETECTION

Optional Information

Notes
(c) 2006 American Institute of Physics