Published November 1996
| Version v1
Journal article
Evaluation of structure parameter errors in the x-ray analysis of disordered systems
- 1. Shevchenko State University, Kiev (Ukraine)
Description
Various approaches to the evaluation of possible errors in the determination of structure parameters in the x-ray diffraction analysis of disordered systems are analyzed. It is shown that the processing of the initial intensity curves of scattered radiation by the Student method results in a sufficiently correct evaluation of both the errors in the determination of the structure parameters and the error function for the curves of structure factors and radial distribution functions of atoms
Additional details
Identifiers
Publishing Information
- Journal Title
- Crystallography Reports
- Journal Volume
- 41
- Journal Issue
- 6
- Journal Page Range
- p. 921-924
- ISSN
- 1063-7745
- CODEN
- CYSTE3
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35073727
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Translation
- Descriptors DEI
- ACCURACY; DIAGRAMS; DISTRIBUTION FUNCTIONS; ERRORS; EVALUATION; MEASURING METHODS; SPATIAL DISTRIBUTION; STRUCTURAL MODELS; STRUCTURE FACTORS; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; DISTRIBUTION; FUNCTIONS; INFORMATION; SCATTERING
Optional Information
- Notes
- Translated from Kristallografiya, ISSN 0023-4761, 41, 971-974 (November-December 1996); (c) 1996 MAIK/Interperiodika