Published September 1, 2000
| Version v1
Report
Development of instrumentation for surface, interface and thin film science at the Advanced Photon Source. Final Technical Report for period September 15, 1994 - September 14, 2000
Description
The P.I. and his research term successfully used the funds FR-om the DOE Instrumentation grant entitled ''Development of Instrumentation for Surface, Interface and Thin Film Science at the Advanced Photon Source'' to design, build, test, and commission a customized surface science x-ray scattering/spectroscopy chamber. This instrumentation, which is presently in use at an APS x-ray undulator beam line operated by the DuPont-Northwestern-Dow Collaborative Access Team, is used for x-ray measurements of surface, interface, thin film, and nano-structures
Availability note (English)
Available at OSTI (Paper copy): phone, 865-576-8401, or email, reports@adonis.osti.govAdditional details
Publishing Information
- Imprint Pagination
- 3 p.
- Report number
- DOE/ER--45527-1
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 34043444
- Subject category
- S43: PARTICLE ACCELERATORS; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Progress Report, Non-conventional Literature
- Descriptors DEI
- ADVANCED PHOTON SOURCE; CONSTRUCTION; DESIGN; INTERFACES; PROGRESS REPORT; SURFACES; TESTING; THIN FILMS; WIGGLER MAGNETS; X-RAY SPECTROMETERS
- Descriptors DEC
- DOCUMENT TYPES; EQUIPMENT; FILMS; MAGNETS; MEASURING INSTRUMENTS; RADIATION SOURCES; SPECTROMETERS; STORAGE RINGS; SYNCHROTRON RADIATION SOURCES
Optional Information
- Contract/Grant/Project number
- FG--02-49ER45527
- Funding organization
- BES, USDOE Office of Energy Research (ER) (United States)