Published March 28, 2014 | Version v1
Journal article

Freeform surface measurement and characterisation using a toolmakers microscope

  • 1. City University of Hong Kong 1 (Hong Kong)

Description

Current freeform surface (FFS) characterization systems mainly cover aspects related to computer-aided design/manufacture (CAD/CAM). This paper describes a new approach that extends into computer-aided inspection (CAI).The following novel features are addressed: - ◼ Feature recognition and extraction from surface data; - ◼ Characterisation of properties of the surface's M and N vectors at individual vertex; - ◼ Development of a measuring plan using a toolmakers microscope for the inspection of the FFS; - ◼ Inspection of the actual FFS produced by CNC milling; - ◼ Verification of the measurement results and comparison with the CAD design data; Tests have shown that the deviations between the CAI and CAD data were within the estimated uncertainty limits

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/483/1/012004

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
483
Journal Issue
1
Journal Page Range
[6 p.]
ISSN
1742-6596

Conference

Title
14. international conference on metrology and properties of engineering surfaces
Dates
17-21 Jun 2013
Place
Taipei, Taiwan (China)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
46073545
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
COMPARATIVE EVALUATIONS; COMPUTER-AIDED DESIGN; COMPUTER-AIDED MANUFACTURING; INSPECTION; MICROSCOPES; MILLING; SURFACES; VECTORS; VERIFICATION
Descriptors DEC
DESIGN; EVALUATION; MACHINING; MANUFACTURING; TENSORS