Freeform surface measurement and characterisation using a toolmakers microscope
- 1. City University of Hong Kong 1 (Hong Kong)
Description
Current freeform surface (FFS) characterization systems mainly cover aspects related to computer-aided design/manufacture (CAD/CAM). This paper describes a new approach that extends into computer-aided inspection (CAI).The following novel features are addressed: - ◼ Feature recognition and extraction from surface data; - ◼ Characterisation of properties of the surface's M and N vectors at individual vertex; - ◼ Development of a measuring plan using a toolmakers microscope for the inspection of the FFS; - ◼ Inspection of the actual FFS produced by CNC milling; - ◼ Verification of the measurement results and comparison with the CAD design data; Tests have shown that the deviations between the CAI and CAD data were within the estimated uncertainty limits
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/483/1/012004Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 483
- Journal Issue
- 1
- Journal Page Range
- [6 p.]
- ISSN
- 1742-6596
Conference
- Title
- 14. international conference on metrology and properties of engineering surfaces
- Dates
- 17-21 Jun 2013
- Place
- Taipei, Taiwan (China)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46073545
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COMPARATIVE EVALUATIONS; COMPUTER-AIDED DESIGN; COMPUTER-AIDED MANUFACTURING; INSPECTION; MICROSCOPES; MILLING; SURFACES; VECTORS; VERIFICATION
- Descriptors DEC
- DESIGN; EVALUATION; MACHINING; MANUFACTURING; TENSORS