Texture examination by electron channeling in the SEM

This paper prevents a method of determining textures by means of channeling in the scanning electron microscope, whose facilities differ from those of x-ray diffraction. Electron channeling patterns (ECP) are formed by the electron wave interacting with the periodic lattice field. The texture was determined on a sheet of TsM-6 molybdenum alloy of thickness 1 mm. Two plates cut from the sheet were arc welded with a tungsten electrode in argon. The ECP was indexed by comparison with a standard patter, which made it possible to construct the inverse polar figure (illustrated). This paper also demonstrates how the channelling method may be used to construct direct plar figures. A limitation of the channelling method in determining crystallographic orientation is that the technique is restricted to shallow depths, and therefore it is very sensitive to surface contamination, oxide films, or work-hardening. However, the shallow penetration in some cases is a basic advantage, for example, in examining the crystallography of thin epitaxial films