Published May 2014
| Version v1
Journal article
Charged-particle acceleration through laser irradiation of thin foils at Prague Asterix Laser System
Creators
- 1. Department of Physics-SDT, University of Messina, V S D'Alcontres 31, I-98166 S. Agata (Italy)
- 2. Department of Physics and Astronomy, University of Catania, V S Sofia 64, I-95124 Catania (Italy)
- 3. Institute of Plasma Physics and Laser Microfusion, 23 Hery Street, 01-497 Warsaw (Poland)
- 4. ASCR-Prague Asterix Laser System (PALS), Na Slovance 2 182 21, Prague 8 (Czech Republic)
Description
Thin foils, 0.5–50 μm in thickness, have been irradiated in vacuum at Prague Asterix Laser System in Prague using 1015–16 W cm−2 laser intensity, 1315 nm wavelength, 300 ps pulse duration and different focal positions. Produced plasmas from metals and polymers films have been monitored in the forward and backward directions. Ion and electron accelerations have been investigated by using Thomson parabola spectrometer, x-ray streak camera, ion collectors and SiC semiconductor detectors, the latter employed in time-of-flight configuration. Ion acceleration up to about 3 MeV per charge state was measured in the forward direction. Ion and electron emissions were detected at different angles as a function of the irradiation conditions. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/0031-8949/2014/T161/014027Additional details
Identifiers
Publishing Information
- Journal Title
- Physica Scripta (Online)
- Journal Volume
- 2014
- Journal Issue
- T161
- Journal Page Range
- [5 p.]
- ISSN
- 1402-4896
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46059867
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- ACCELERATION; CHARGE STATES; ELECTRON EMISSION; ELECTRONS; FOILS; ION EMISSION; IRRADIATION; LASER RADIATION; LASER-PRODUCED PLASMA; MEV RANGE; PLASMA DIAGNOSTICS; PLASMA PRODUCTION; SEMICONDUCTOR DETECTORS; SILICON CARBIDES; STREAK CAMERAS; TIME-OF-FLIGHT METHOD; X RADIATION
- Descriptors DEC
- CAMERAS; CARBIDES; CARBON COMPOUNDS; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; EMISSION; ENERGY RANGE; FERMIONS; IONIZING RADIATIONS; LEPTONS; MEASURING INSTRUMENTS; PLASMA; RADIATION DETECTORS; RADIATIONS; SILICON COMPOUNDS